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Date : 2002-10-31
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030647350X
High Resolution Focused Ion Beams FIB and Its Applications ~ High Resolution Focused Ion Beams FIB and Its Applications Jon Orloff Mark Utlaut and Lynwood Swanson Kluwer AcademicPlenum New York 2003 14500 303 pp ISBN 030647350X Buy at Amazon
High Resolution Focused Ion Beams FIB and its ~ Buy High Resolution Focused Ion Beams FIB and its Applications The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology on FREE SHIPPING on qualified orders
HIGH RESOLUTION FOCUSED ION BEAMS FIB AND ITS APPLICATIONS ~ HIGH RESOLUTION FOCUSED ION BEAMS FIB AND ITS APPLICATIONS The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology Jon Ortoff University of Maryland College Park Maryland Mark Uttaut University of Portland Portland Oregon and Lynwood Swanson FIE Company Hillsboro Oregon
High Resolution Focused Ion Beams FIB and its Applications ~ High Resolution Focused Ion Beams FIB and its Applications Article in Physics Today 571 · January 2003 with 121 Reads How we measure reads
Customer reviews High Resolution Focused Ion ~ Find helpful customer reviews and review ratings for High Resolution Focused Ion Beams FIB and its Applications The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology at Read honest and unbiased product reviews from our users
High Resolution Focused Ion Beams FIB and its ~ In this book we have attempted to produce a reference on high resolution focused ion beams FIBs that will be useful for both the user and the designer of FIB instrumentation We have included a mix of theory and applications that seemed most useful to us The field of FIBs has advanced rapidly
High Resolution Focused Ion Beams FIB and its ~ In this book we have attempted to produce a reference on high resolution focused ion beams FIBs that will be useful for both the user and the designer of FIB instrumentation We have included a mix of theory and applications that seemed most useful to us The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s
High Resolution Focused Ion Beams FIB and its Applications ~ The possibility of applying a field emission ion source to produce a focused ion beam was first demonstrated in the early 1970’s by LeviSetti et al Escovitz l975ab LeviSetti 1974 and by
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Focused ion beam Wikipedia ~ Focused ion beam also known as FIB is a technique used particularly in the semiconductor industry materials science and increasingly in the biological field for sitespecific analysis deposition and ablation of materials A FIB setup is a scientific instrument that resembles a scanning electron microscope SEM
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